Berenguer, F, Pettinari, G, Felici, M, Balakrishnan, N ORCID: https://orcid.org/0000-0002-7236-5477, Clark, JN, Ravy, S, Patané, A, Polimeni, A and Ciatto, G (2020) Imaging shape and strain in nanoscale engineered semiconductors for photonics by coherent x-ray diffraction. Communications Materials, 1 (1).

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Additional Information: Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/.
Uncontrolled Keywords: Imaging techniques; Photonic crystals; Synthesis and processing
Subjects: Q Science > Q Science (General)
Q Science > QA Mathematics > QA75 Electronic computers. Computer science
Divisions: Faculty of Natural Sciences > School of Chemical and Physical Sciences
Depositing User: Symplectic
Date Deposited: 30 Apr 2020 08:58
Last Modified: 30 Apr 2020 08:58
URI: http://eprints.keele.ac.uk/id/eprint/7912

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