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Anomalous Low Thermal Conductivity of Atomically Thin InSe Probed by Scanning Thermal Microscopy

Mazumder, Debarati; Castanon, Eli; D. Kovalyuk, Zakhar; Kolosov, Oleg; Kazakova, Olga; Tzalenchuk, Alexander; Patanè, Amalia; Balakrishnan, Nilanthy; Nilanthy, B; Vincent, Tom; Buckley, David; R. Kudrynskyi, Zakhar

Authors

Debarati Mazumder

Eli Castanon

Zakhar D. Kovalyuk

Oleg Kolosov

Olga Kazakova

Alexander Tzalenchuk

Amalia Patanè

B Nilanthy

Tom Vincent

David Buckley

Zakhar R. Kudrynskyi



Abstract

The ability of a material to conduct heat influences many physical phenomena, ranging from thermal management in nanoscale devices to thermoelectrics. Van der Waals two dimensional (2D) materials offer a versatile platform to tailor heat transfer due to their high surface-to-volume ratio and mechanical flexibility. Here, the nanoscale thermal properties of 2D indium selenide (InSe) are studied by scanning thermal microscopy. The high electrical conductivity, broad-band optical absorption and mechanical flexibility of 2D InSe are accompanied by an anomalous low thermal conductivity (?). This can be smaller than that of low-? dielectrics, such as silicon oxide, and it decreases with reducing the lateral size and/or thickness of InSe. The thermal response is probed in free-standing InSe layers as well as layers supported by a substrate, revealing the role of interfacial thermal resistance, phonon scattering, and strain. These thermal properties are critical for future emerging technologies, such as field effect transistors that require efficient heat dissipation or thermoelectric energy conversion with low-?, high electron mobility 2D materials, such as InSe.

Journal Article Type Article
Acceptance Date Dec 2, 2020
Online Publication Date Jan 12, 2021
Publication Date 2021-03
Journal Advanced Functional Materials
Print ISSN 1616-301X
Publisher Wiley
Peer Reviewed Peer Reviewed
Volume 31
Issue 11
Article Number 2008967
DOI https://doi.org/10.1002/adfm.202008967
Keywords 2D semiconductors, InSe, phonons, scanning thermal microscopy, thermal conductivity
Publisher URL https://onlinelibrary.wiley.com/doi/10.1002/adfm.202008967