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Austin, J (2011) Requirements for commercial X-ray element-specific imaging technology. Insight, 53 (3). 127 - 131. ISSN 1354-2575

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Abstract

Analysis of the composition of material samples nondestructively by means of standard X-ray tube imaging
is extremely challenging due to the breadth of the
bremsstrahlung spectrum, resulting from mono-energetic
electrons striking a thick tungsten target. In previous work,
stacks of registered field-flattened images of various samples
over an energy range 15-150 keV were created and analysed.
Attempts to remove the effects of the broad spectrum proved
the concept of element-specific imaging, but problems still
remained. In this work, modification strategies to existing
designs are proposed in both hardware and software, which
would bolster efforts to remove the effects of the broad X-ray spectrum.

Item Type: Article
Additional Information: The final version of this article and all relevant information regarding copyrights and more can be found at; https://www.ingentaconnect.com/content/bindt/insight/2011/00000053/00000003/art00003
Uncontrolled Keywords: Element-specific imaging; X-ray absorption; X-ray imaging; elemental mapping; greyscale; non-destructive testing
Subjects: Q Science > Q Science (General)
Q Science > QC Physics
T Technology > T Technology (General)
T Technology > TA Engineering (General). Civil engineering (General)
Divisions: Faculty of Natural Sciences > School of Computing and Mathematics
Related URLs:
Depositing User: Symplectic
Date Deposited: 13 Aug 2020 11:16
Last Modified: 09 Mar 2021 10:00
URI: https://eprints.keele.ac.uk/id/eprint/8540

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