Reflectivity and diffraction study of Co/Cu multilayer using synchrotron X-rays

Tang, C.C.; MacLean, E.J.; Telling, N.D.

doi:10.1016/s0304-8853(98)01176-7

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Microstructure of Fe–N thin films prepared using an atomic nitrogen beam (2001)
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The formation of Fe–N thin films by exposure to an atomic (free radical) nitrogen beam is reported. This new method of preparing Fe–N films uses fluxes of highly reactive, thermal energy N atoms that do not disturb the film microstructure. It is show... Read More about Microstructure of Fe–N thin films prepared using an atomic nitrogen beam.

Multilayer growth by low energy ion beam deposition (1999)
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We report our progress in the development of a relatively new deposition technique, that of direct low energy ion beam deposition. We describe this technique, which is based on ion implanter technology similar to that used in the semiconductor indust... Read More about Multilayer growth by low energy ion beam deposition.

The effect of energetic ion bombardment during growth on the interface structure of Co/Cu multilayers (1999)
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A modified unbalanced magnetron sputtering technique was applied to the growth of multilayer Co/Cu films in order to systematically study the interface structure evolved under ion bombardment. X-ray reflectivity measurements revealed an interface smo... Read More about The effect of energetic ion bombardment during growth on the interface structure of Co/Cu multilayers.

Spin polarised neutron and X-ray reflectivity study of a Co/Cu multilayer deposited under ion bombardment (1999)
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Spin polarised neutron reflectivity and X-ray reflectivity measurements were performed on a Co/Cu multilayer deposited under ion bombardment. It was found that an average ion energy of ∼200 eV caused a reduction in interface roughness towards the sur... Read More about Spin polarised neutron and X-ray reflectivity study of a Co/Cu multilayer deposited under ion bombardment.

Reflectivity and diffraction study of Co/Cu multilayer using synchrotron X-rays (1999)
Journal Article

Synchrotron powder diffraction measurements were obtained from a Co/Cu multilayer produced by low energy ion-assisted deposition. The experiment was carried out on the high resolution diffractometer on Station 2.3 at the SRS, Daresbury Laboratory. Ex... Read More about Reflectivity and diffraction study of Co/Cu multilayer using synchrotron X-rays.