Keele Research Repository

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Berenguer, F, Pettinari, G, Felici, M, Balakrishnan, N ORCID: https://orcid.org/0000-0002-7236-5477, Clark, JN, Ravy, S, Patané, A, Polimeni, A and Ciatto, G (2020) Imaging shape and strain in nanoscale engineered semiconductors for photonics by coherent x-ray diffraction. Communications Materials, 1.

Ciatto, G, Pettinari, G, Balakrishnan, N, Berenguer, F, Patanè, A, Birindelli, S, Felici, M and Polimeni, A (2015) Synchrotron x-ray diffraction study of micro-patterns obtained by spatially selective hydrogenation of GaAsN. Applied Physics Letters, 106 (5). 051905 - 051905.